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METHOD FOR DEVELOPING ACCELERATION MODELS FOR ELECTRONIC COMPONENT FAILURE MECHANISMS

Status: ReaffirmedJanuary 2011 		JESD91A Aug 2003

The method described in this document applies to all reliability mechanisms associated with electronic components.The purpose of this standard is to provide a reference for developing acceleration models for defect-related and wear-out mechanisms in electronic components

Committee(s): JC-14, JC-14.3

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