Global Standards for the Microelectronics Industry
Standards & Documents Search
Displaying 1 - 2 of 2 documents.
| Title | Document # | Date |
|---|---|---|
SOLID-STATE DRIVE (SSD) ENDURANCE WORKLOADS |
JESD219A | Jul 2012 |
This standard defines workloads for the endurance rating and endurance verification of SSD application classes. These workloads shall be used in conjunction with the Solid State Drive (SSD) Requirements and Endurance Test Method standard, JESD218. Also see JESD219A_MT and JESD219A_TT for the supporting trace files. Free download. Registration or login required. |
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STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS |
JESD47I.01 | Sep 2016 |
This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed. This is a minor editorial revision to JESD47I, published December 2015. Committee(s): JC-14.3 Free download. Registration or login required. |
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