Standards & Documents Search

Displaying 1 - 1 of 1 documents.

Title Document # Date

STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS

 JESD47I.01 Sep 2016

This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed. This is a minor editorial revision to JESD47I, published December 2015.

Committee(s): JC-14.3

Free download. Registration or required.

Search by Keyword or Document Number

or Reset