Global Standards for the Microelectronics Industry
JEDEC Publishes New Test Standard to Measure Effects of Proton Radiation on Electronic Devices
ARLINGTON, Va., USA – OCTOBER 16, 2013 – JEDEC Solid State Technology Association, the global leader in the development of standards for the microelectronics industry, today announced the publication of JESD234 Test Standard for the Measurement of Proton Radiation Single Event Effects in Electronic Devices. Developed in response to the present lack of a prevailing industry standard for proton induced upset testing for electronic devices used in outer space; the new standard assists with proton testing in several areas, including pre-trip planning, decision making during the test, and post-exposure planning and analysis. JESD234 is available for free download from the JEDEC website: http://www.jedec.org/standards-documents/results/jesd234.
The new standard also forewarns the “bounds” to an acceptable proton test covered by this standard. For example, items discussed as being excluded in this standard are low energy proton testing (< 5MeV), proton tests with excessive total dose and the assumption that latchup testing is energy independent. JESD234 assures the user that:
- bounding an acceptable indirect ionization upset test as being done with energies between 40 – 500 MeV
- consideration must be given to device overlayers and package lids
- a discussion on the clarity between destructive and non-destructive events
- angular testing is different from that described in heavy ion testing and
- provides a listing of proton induced dominant SEEs
“The radiation effects test and programmatic community has requested a proton SEE test standard for many years,” said Reed Lawrence, Chairman of the JC-13.4 Subcommittee for Radiation Hardness: Assurance and Characterization. He added: “JEDEC believes this new standard will meet the community’s needs for a test able to simulate the harsh environment of outer space.”
About JEDEC
JEDEC is the leading developer of standards for the microelectronics industry. Over 4,000 participants, appointed by nearly 300 companies, work together in 50 JEDEC committees to meet the needs of every segment of the industry, manufacturers and consumers alike. The publications and standards that they generate are accepted throughout the world. All JEDEC standards are available online, at no charge. For more information, visit www.jedec.org.
Contact:
Emily Desjardins
703-907-7560
emilyd@jedec.org
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